Author: Reymond, H.
Paper Title Page
TUPDP087 Enhancing Measurement Quality in HL-LHC Magnets Testing Using Software Techniques on Digital Multimeter Cards-Based System 729
 
  • H. Reymond, O.Ø. Andreassen, M. Charrondiere, C. Charrondière, P.D. Jankowski
    CERN, Meyrin, Switzerland
 
  The HL-LHC magnets play a critical role in the High-Luminosity Large Hadron Collider project, which aims to increase the luminosity of the LHC and enable more precise studies of fundamental physics. Ensuring the performance and reliability of these magnets requires high-precision measurements of their electrical properties during testing. To meet the R&D program needs of the new superconducting magnet technology, an accurate and generic voltage measurement system was developed after the testing and validation campaign of the LHC magnets. The system was based on a set of digital multimeter (DMM) cards installed in a PXI modular chassis and controlled using CERN’s in-house software development. It allowed for the measurement of the electrical properties of the magnet prototypes during their study phase. However, during the renovation of the magnet test benches and in preparation for the HL-LHC magnet series measurement, some limitations and instabilities were discovered during long recording measurements. As a result, it was decided to redesign the measurement system. The emergence and promises of the new PXIe platform, along with the requirement to build eight new systems to be operated similarly to the existing four, led to a complete redesign of the software. This article describes the various software techniques employed to address platform compatibility issues and significantly improve measurement accuracy, thus ensuring the reliability and quality of the data obtained from the HL-LHC magnet tests.  
poster icon Poster TUPDP087 [6.660 MB]  
DOI • reference for this paper ※ doi:10.18429/JACoW-ICALEPCS2023-TUPDP087  
About • Received ※ 02 October 2023 — Revised ※ 09 October 2023 — Accepted ※ 12 October 2023 — Issued ※ 13 October 2023
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THPDP002 The Micro-Services of Cern’s Critical Current Test Benches 1295
 
  • C. Charrondière, A. Ballarino, C. Barth, J.F. Fleiter, P. Koziol, H. Reymond
    CERN, Meyrin, Switzerland
  • O.Ø. Andreassen, T. Boutboul, S.C. Hopkins
    European Organization for Nuclear Research (CERN), Geneva, Switzerland
 
  In order to characterize the critical-current density of low temperature superconductors such as niobium¿titanium (NbTi) and niobium¿tin (Nb₃Sn) or high temperature superconductors such as magnesium-diboride MgB₂ or Rare-earth Barium Copper Oxide REBCO tapes, a wide range of custom instruments and interfaces are used. The critical current of a superconductor depends on temperature, magnetic field, current and strain, requiring high precision measurements in the nano Volt range, well-synchronized instrumentation, and the possibility to quickly adapt and replace instrumentation if needed. The micro-service based application presented in this paper allows operators to measure a variety of analog signals, such as the temperature of the cryostats and sample under test, magnetic field, current passing through the sample, voltage across the sample, pressure, helium level etc. During the run, the software protects the sample from quenching, controlling the current passed through it using high-speed field programmable gate array (FPGA) systems on Linux Real-Time (RT) based PCI eXtensions controllers (PXIe). The application records, analyzes and reports to the external Oracle database all parameters related to the test. In this paper, we describe the development of the micro-service based control system, how the interlocks and protection functionalities work, and how we had to develop a multi-windowed scalable acquisition application that could be adapted to the many changes occurring in the test facility.  
poster icon Poster THPDP002 [6.988 MB]  
DOI • reference for this paper ※ doi:10.18429/JACoW-ICALEPCS2023-THPDP002  
About • Received ※ 06 October 2023 — Revised ※ 10 October 2023 — Accepted ※ 13 October 2023 — Issued ※ 26 October 2023
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