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The PAL-XFEL beamlines are composed of two different types of beamlines: a hard X-ray beamline and a soft X-ray beamline. The hard X-ray beamline generates free electron lasers with pulse energies ranging from 2-15 keV, pulse lengths of 10-35 fs, and arrival time errors of less than 20 fs from 4-11 GeV electron beams for X-ray Scattering & Spectroscopy (XSS) and Nano Crystallography & Coherent Imaging (NCI) experiments. On the other hand, the soft X-ray beamline generates free electron lasers with photon energies ranging from 0.25-1.25 keV, and with more than 1012 photons, along with 3 GeV electron beams for soft X-ray Scattering & Spectroscopy (SSS) experiments. To conduct experiments using the XFEL, precise beam alignment, diagnostics, and control of experimental devices are necessary. The devices of the three beamlines are composed of control systems based on the Experimental Physics and Industrial Control System (EPICS), which is a widely-used open-source software framework for distributed control systems. The beam diagnostic devices include QBPM (Quad Beam Position Monitor), photodiode, Pop-in monitor, and inline spectrometer, among others. Additionally, there are other systems such as CRL (Compound Refractive Lenses), KB mirror (Kirkpatrick-Baez mirror), attenuator, and vacuum that are used in the PAL-XFEL beamlines. We would like to introduce the control system, event timing, and network configuration for PAL-XFEL experiments.
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