Author: Kardoost, A.K.
Paper Title Page
MO2AO03 The Solid Sample Scanning Workflow at the European XFEL 78
 
  • A. García-Tabarés Valdivieso, C. Deiter, L. Gelisio, S. Göde, S. Hauf, A.K. Kardoost, I. Karpics, J. Schulz, F. Sohn
    EuXFEL, Schenefeld, Germany
 
  The fast solid sample scanner (FSSS) used at the HED instrument of the European XFEL (EuXFEL) enables data collection from multiple samples mounted into standardized frames which can be exchanged via a transfer system without breaking the interaction chamber vacuum. In order to maximize the effective target shot repetition rate, it is a key requirement to use sample holders containing pre-aligned targets measured on an accurate level of a few micrometers. This contribution describes the automated sample delivery workflow for performing solid sample scanning using the FSSS. This workflow covers the entire process, from automatically identifying target positions within the sample, using machine learning algorithms, to set the parameters needed to perform the scans. The integration of this solution into the EuXFEL control system, Karabo, not only allows to control and perform the scans with the existing scan tool but also provides tools for image annotation and data acquisition. The solution thus enables the storage of data and metadata for future correlation across a variety of beamline parameters set during the experiment.  
slides icon Slides MO2AO03 [12.892 MB]  
DOI • reference for this paper ※ doi:10.18429/JACoW-ICALEPCS2023-MO2AO03  
About • Received ※ 06 October 2023 — Revised ※ 09 October 2023 — Accepted ※ 11 December 2023 — Issued ※ 20 December 2023
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