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TY - CONF AU - Campoi, L.B.C. AU - Costa, G.S.R. AU - Lopes Archilha, N. AU - Moreno, G.B.Z.L. AU - Vecina, L.E.P. ED - Schaa, Volker RW ED - Götz, Andy ED - Venter, Johan ED - White, Karen ED - Robichon, Marie ED - Rowland, Vivienne TI - Piezo Motor Based Hardware Triggered Nano Focus Caustic Acquisition J2 - Proc. of ICALEPCS2023, Cape Town, South Africa, 09-13 October 2023 CY - Cape Town, South Africa T2 - International Conference on Accelerator and Large Experimental Physics Control Systems T3 - 19 LA - english AB - The evaluation of the focus produced by a KB (Kirkpatrick-Baez) mirror system is a challenging endeavor. In MOGNO (Micro and nano tomography) beamline’s case at Sirius, the KB was designed to produce a focus of 150x150 nm2, requiring a setup to evaluate the mirrors’ alignment in a timely manner. The developed diagnostic system is comprised of a stack of three linear inertia drive piezo stages and a fluorescence detector, acquiring data via hardware-triggered mesh scans. In the piezo stack, the stages are mounted along the X (horizontal, perpendicular to the beam path), Z (along the beam path) and YZ beamline directions. Moreover, the fact that a stage is placed at an angle requires the use of a kinematic transformation when scaning the focus along the Y axis, while the X axis scan can be done with a pure motion. The mesh scan can be diveded in two parts: hardware triggered line scan acquisition along X or Y and software triggered steps along Z between scans. In this manner, the control is done via a collection of low-level controller macros and Python scripts, such that during the scans, the piezo controllers communicate with each other and the detector via digital pulses, orchestrated by the in-house TATU (Timing and Trigger Unit) software, reducing dead time between acquisition points. The proposed system proved to be reliable to acquire beam profiles, providing caustics in both horizontal and vertical directions. Currently, the acquired focus caustics indicate that the main source has a size of approximately 480x500 nm2. PB - JACoW Publishing CP - Geneva, Switzerland SP - 1285 EP - 1289 KW - controls KW - hardware KW - detector KW - alignment KW - software DA - 2024/02 PY - 2024 SN - 2226-0358 SN - 978-3-95450-238-7 DO - doi:10.18429/JACoW-ICALEPCS2023-THMBCMO35 UR - https://jacow.org/icalepcs2023/papers/thmbcmo35.pdf ER -